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Blogs

Discover expert-led blog posts that take a closer look at the capabilities, features, and applications of our precision instruments.

Harnessing the power of cathodoluminescence in a benchtop SEM

TM4000 | Benchtop SEM | SEM
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Why electron microscopy is critical for battery research

Battery | SEM
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The importance of high-quality cross-sectioning for battery research

Broad Ion Beam | Sample Preparation | Battery
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ArBlade 5000: An Innovative, High-Performance Sample Preparation Tool for SEM

ArBlade 5000 | Ion Milling | Broad Ion Beam | Sample Preparation
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Preparing complex samples for analysis with Hitachi’s ArBlade 5000 ion milling system

ArBlade 5000 | Products | Ion Milling
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Exploring the benefits of Hitachi’s SU8600 and SU8700 Field Emission SEMs

SU8600 | SU8700 | Products | Schottky Field Emission | Cold Field Emission
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Hitachi High-Tech Europe | TM4000

What our application experts think about the TM4000 benchtop microscopes

TM4000 | Products | Benchtop SEM
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