Understand structures and materials at the nanoscale

From entry-level tabletop Scanning Electron Microscopes (SEM) to ultrahigh performance Focused Ion Beam SEM (FIB-SEM), our extensive range of electron microscopy and ion beam milling systems will empower you to observe, measure and analyse with precision.

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HT8700_AI models

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Product Overview Page_SU3800 SE Plus - 2,250 x 1,500 px

SU3900 / SU3800
Family

Focused on enhancing productivity, these tools automate repetitive tasks, so you can achieve reproducible results quickly with little manual effort.

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Product Overview Page_TM4000 Plus III - 2,250 x 1,500 px

TM4000PlusIII Tabletop SEM

Bridging the gap between optical microscopy and conventional large SEMs, the TM4000PlusIII is a high-performance tabletop SEM for flexible imaging needs in academia and industry.

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Product Overview Page_IM4000 II + ArBlade5000

IM4000II & ArBlade 5000

Advanced Ion Milling Systems for fast, high-quality SEM sample preparation.

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Product Overview Page_FlexSEM II - 2,250 x 1,500 px

FlexSEM II

Offering full SEM functionality in a compact, intuitive design, it's the ideal system for superior imaging and detector variability without the cost of a classic SEM.

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Take a virtual tour of the lab

Take an interactive tour of our German electron microscopy application lab. Learn more about the instruments, including descriptions, videos and links to additional information.

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"I would definitely recommend Hitachi to other interested parties and would also choose Hitachi again in a subsequent decision."

BIOTRONIK representative, user of SU7000 SEM and ArBlade 5000

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Our service and applications support team can advise on the best product solution for your individual needs.