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Understand structures and materials at the nanoscale

From entry-level tabletop Scanning Electron Microscopes (SEM) to ultrahigh performance Focused Ion Beam SEM (FIB-SEM), our extensive range of electron microscopy and ion beam milling systems will empower you to observe, measure and analyse with precision.

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TM4000IIIPlus

TM4000PlusIII Tabletop SEM

Bridging the gap between optical microscopy and conventional large SEMs, this is a high-performance tool for flexible imaging needs in academia and industry.

IM5000 with OM (4)

ArBlade 5000 Ion Milling System

The most advanced broad ion beam system for producing exceptionally high-quality cross-section or flat-milling samples for electron microscopy.

SU3800SE-SU3900SE

SU3900/3800 Family

Focused on enhancing productivity, these tools automate repetitive tasks, so you can achieve reproducible results quickly with little manual effort.

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BIOTRONIK

I would definitely recommend Hitachi. The guidance and the option to acquire complementary systems from a single manufacturer are definitely worth mentioning here.

Take a virtual tour of the lab

Take an interactive tour of our German electron microscopy application lab. Learn more about the instruments, including descriptions, videos and links to additional information.

To discuss the best product solution for your needs, get in touch with our experts.

Events and webinars

30 June

Event

SuperSTEM inauguration

Daresbury, UK

Registration coming soon

1 - 3 July

Tradeshow

mmc2025

Manchester, UK

Book a demo

9 - 10 July

Tradeshow

Battery Cells & Systems Expo

Birmingham, UK

Learn more

31 Aug - 4 Sep

Tradeshow

MC2025

Karlsruhe, Germany

Learn more

Speak with our experts

Our service and applications support team can advise on the best product solution for your individual needs.