Understand structures and materials at the nanoscale
From entry-level tabletop Scanning Electron Microscopes (SEM) to ultrahigh performance Focused Ion Beam SEM (FIB-SEM), our extensive range of electron microscopy and ion beam milling systems will empower you to observe, measure and analyse with precision.
Explore our product highlights

TM4000PlusIII Tabletop SEM
Bridging the gap between optical microscopy and conventional large SEMs, this is a high-performance tool for flexible imaging needs in academia and industry.
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ArBlade 5000 Ion Milling System
The most advanced broad ion beam system for producing exceptionally high-quality cross-section or flat-milling samples for electron microscopy.

SU3900/3800 Family
Focused on enhancing productivity, these tools automate repetitive tasks, so you can achieve reproducible results quickly with little manual effort.

BIOTRONIK
I would definitely recommend Hitachi. The guidance and the option to acquire complementary systems from a single manufacturer are definitely worth mentioning here.
Take a virtual tour of the lab
Take an interactive tour of our German electron microscopy application lab. Learn more about the instruments, including descriptions, videos and links to additional information.
To discuss the best product solution for your needs, get in touch with our experts.
Events and webinars
30 June
Event
SuperSTEM inauguration
Daresbury, UK
Registration coming soon
1 - 3 July
9 - 10 July
31 Aug - 4 Sep
Speak with our experts
Our service and applications support team can advise on the best product solution for your individual needs.