Additional Resources

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On-demand webinar: Preparation of superb cross sections for SEM investigations by applying Broad Ion Beam (BIB) Milling.

On-demand webinar: How to do accurate, fast sample analysis with a tabletop electron microscope equipped with EDS

On-demand webinar: Automated SEM for Particle Analysis

On-demand webinar: Optimized elemental analysis with tabletop electron microscopes

On-demand webinar: Practical image analysis using AI/Machine Learning and Image-Pro software

On-demand webinar: SEM for Surface Metrology: When Optical and Stylus Methods Are Not Enough

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Application Note: IM5000

Application Note: SU3800/SU3900

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Whitepaper: Understanding and controlling battery materials

Whitepaper: Broad Ion Beam (BIB) Milling

Whitepaper: SEM-based particle and fibre analysis

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Application Note: Hitachi IM5000

Application Note: Hitachi SU3800/SU3900 SEM Family

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Product Catalogue: In English

Product Catalogue: In German

FlexSEMII Product Guide: The smart little SEM that flexibly adjusts to your skills and needs

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Video: Introducing SEM, TEM, FIB & Prep Solutions From Hitachi High-Tech

Video: Introducing the Hitachi High-Tech ArBlade 5000

Video: Introducing the Hitachi High-Tech TM4000PlusIII

Video: Introducing the Hitachi High-Tech CFE - SEM SU8600