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From Sample to Insight: Solving Microscopy Challenges at mmc2025

Whether you're preparing delicate materials or pushing the limits of nanoscale imaging, Hitachi is here to help you solve your toughest microscopy challenges. At mmc2025 (find us at Booth 417), our team of applications specialists will be on hand to help you improve your microscopy workflows from start to finish — including the latest in sample preparation, automation and AI image analysis across SEM and TEM.

Join our pre-congress event with SuperSTEM

Hitachi is also proud to support a pre-congress inauguration workshop taking place at SuperSTEM on Monday 30th June. Featuring invited speakers from across the globe, this event offers a great opportunity to learn more about the latest STEM and FIB technologies directly from leading microscopists. The day will also showcase the capabilities of Hitachi’s SU9000EA (T)SEM with EELS, and the NX5000 Triple-beam FIB-SEM. To learn more or to register, click here.

Explore Hitachi's solutions at Booth 417

During mmc itself, you’ll find the SU3900SE making its European debut. This new Schottky VP-SEM offers advanced automation and sample handling for the largest and heaviest samples (up to 300 mm wide and 5 kg in weight). Our ever popular benchtop SEM lineup, including the TM4000PlusIII and FlexSEM II will be available, both offering fast, user-friendly imaging and analysis. For those seeking ultimate performance on nanomaterials, you can see the SU9000 (T)SEM in action, offering unique capabilities more commonly associated with advanced TEMs.

Hitachi’s expertise doesn’t stop at the electron microscope itself. Our range of sample preparation tools, including broad ion beam milling (BIB) and UV cleaning systems, can help you greatly improve the quality of your data. The ArBlade 5000 BIB will be on display to show you the latest cross-sectioning techniques.

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Learn how to work smarter with AI in our lunchtime workshop

And if extracting data from your images is important to you, don’t miss our lunchtime workshop: Work Smarter: AI Image Analysis of Automated EM Datasets”. Learn how to automatically acquire large EM datasets with Flow Creator, then turn them into usable insights using AI and deep learning. This joint session with Media Cybernetics takes place at 1:30pm on Tuesday, July 1st, in Workshop Area 1.

If you’re attending mmc2025 and want to streamline your microscopy workflow — or simply want to discuss the best solution for your application — we’d love to hear from you. Drop by the Hitachi booth (Booth 417), book a demo with one of our specialists, or register for the SuperSTEM event.

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