SU9000II
An ultra-high resolution cold field emission scanning electron microscope (CFE-SEM). The Hitachi SU9000II is designed to deliver the highest imaging performance with superior beam brightness and stability. Engineered for both academic research and industrial applications, the SU9000II gives you precise imaging and elemental analysis at the nanometer and atomic scale.
SU3900SE
A modular Schottky SEM for large samples and automation, the Hitachi SU3900SE gives you an imaging and analytical solution for a wide range of applications. It delivers high-resolution imaging, easy sample navigation, and advanced automation features - offering reliable, consistent results across different use cases.
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