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SU3800SE-SU3900SE

SU3800SE and SU3900SE SEM

Advanced SEMs for fast, high-quality imaging and automated workflows

WHY CHOOSE THE SU3800SE and SU3900SE?
 

The Hitachi SU3800SE and SU3900SE scanning electron microscopes give you an imaging and analytical solution for a wide range of applications. These instruments deliver high-resolution imaging, easy sample navigation, and advanced automation features - offering reliable, consistent results across different use cases. Whether you need to handle standard samples or larger industrial materials, these SEMs give you the versatility and stability to support your lab’s goals. Ideal for both research labs and industrial environments, the SU3800SE and SU3900SE help reduce time to data, enhance productivity, and ensure reproducible results. 

Features

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Can handle a wide range of sample sizes

  • Both the SU3800SE and SU3900SE feature heavy-duty, accurate eucentric 5-axes specimen stages.
  • SU3900SE: Capable of accommodating specimens up to 300mm in diameter, 130mm in height, and 5kg in weight. You can navigate on all 5 stage axes. Ideal for imaging large, heavy industrial materials such as automotive components without needing to cut them down to smaller sizes, saving you time. Or you can accommodate multiple samples, e.g. up to 11 filters of 47mm diameter for long-term automated inspections.
  • SU3800SE: Designed for smaller specimens up to 200mm in diameter, 80mm in height, and 2kg in weight. Provides the flexibility needed for general sample analysis across a wide range of fields.

  • Whether you’re working with standard lab samples or large industrial materials, these SEMs can meet your needs.

Effortless navigation and precision control

  • Equipped with a motorized, eucentric 5-axis stage (X, Y, Z, tilt, and rotation), providing full control over specimen positioning.
  • Automatically activated stage collision model ensures worry-free navigation.
  • Advanced optical camera system covers the entire range of motion, enabling precise and easy navigation across large samples.
  • Enhance your observation capabilities with seamless specimen navigation, ensuring accurate and consistent imaging every time.
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SU3900SE interface

High-resolution and auto-aligned imaging for consistent, high-quality results

  • The Schottky field emission powered optics don’t interact with the specimen, magnetically or electrically. So these microscopes offer consistently high imaging performance across a wide range of specimens.

  • A variable pressure mode is provided as standard. This enables easy observation and high–current analysis of non-conductive samples without needing further sample preparation.

  • Auto-alignment functions for the optics are fast and accurate. So inexperienced operators can obtain high quality results quickly.

Automated workflows free your time for other work

  • The EM Flow Creator function allows you to automate repetitive imaging tasks, significantly reducing operator workload.
  • Configure custom observation recipes that include magnification, focus, stage position, and more—ensuring consistent, high-quality results with minimal intervention on your part.
  • Ideal for labs aiming to optimize efficiency and ensure reproducibility in their imaging processes.
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Fracture surface of iron wire
Microcavitation due to ductile failure can be seen.

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SUS316
Line-like contrast suggestive of dislocations can be seen.

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Printed circuit board
The 3D shapes and positions of mounted components can be seen using low magnification/high-tilt observation.

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Cross section of layered ceramic capacitor
The composition and crystal contrast of nickel electrodes/dielectric layer can be observed.

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Zinc oxide particles
Fine particles with sizes of about 50 nm and 3D shape can be seen.

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High-entropy carbide film
Distribution of particles with different compositions/shapes can be seen.

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Lithium-ion battery cathode material
Distributions of cathode material particles and surrounding binder can be seen.

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Lithium-ion battery anode material
Lithium-ion battery anode material and binder is clearly distinguished using static voltage contrast.

Specifications

Item SU3900SE/SE Plus SU3800SE/SE Plus
Electron Optics Secondary Electron Image resolution 0.9nm@30kV
2.5nm@1kV
1.6nm@1kV (*1) (*2)
Magnification 5~600,000×
Electron Gun ZrO/W Schottky Emitter
Accelerating Voltage 0.5kV~30kV
Landing Voltage (*1) (*2) 0.1kV~2kV
Detectors Standard Detectors Secondary Electron Detector (SED)
TOP detector (TD) (*2)
41+1-segment Semiconductor Type Backscattered Electron Detector (BSED)
Optional Detector (*3) Ultra Variable Pressure Detector (UVD)
Specimen Stage Stage Control 5-axis Motor Drive
Movable Range X 0~150mm 0~100mm
Y 0~150mm 0~50mm
Z 3~85mm 3~65mm
T -20~90°
    R 360°
Specimen Chamber Mountable Specimen Size Max. φ 300mm Max. φ 200mm