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ArBlade 5000 Ion Milling System
High-performance Ar+ cross-section and flat surface polisher
WHY CHOOSE THE ARBLADE 5000
The sophisticated ion beam milling system from Hitachi can be used to prepare customized cross-sections measuring up to 10 mm wide. It also enhances pre-polished surfaces of samples that are often hard to prepare through conventional means (such as polishing, grinding and cutting).
Features
Processing Performance
- Custom width uniform cross-sections measuring up to 10 mm wide can be processed
- Final polishing, for example, for EBSD, utilizing low angle milling (FlatMilling), or for contrasting by high angle milling (relief milling), in just a few minutes
- A single powerful ion beam gun allows high milling speed
- Constant ion beam emission from sub-1 kV accelerating voltage
- Supports fine-surface polishing of sensitive materials


Easy Sample Handling
- Milling position can be readjusted at all times without remounting the specimen
- Ex-situ alignment of mask and cross-sectioning range makes setup fast and easy
- Resin-embedded samples of up to 25 mm in height and 50 mm in diameter can be loaded for ultimate polishing
Simple Operation
- Easy maintenance and setup with a single ion beam gun
- Single button push to initiate a process
- Programmable multi-step processes

Extendibility
- Cryo cooling allows cross-sections on heat sensitive materials
- Multi-position auto-processing, recipe management and workflow creation
- Treating oxidation sensitive sample (such as LiB electrodes) without making contact with air
Specifications
Description | |
---|---|
Gas used | Ar(argon) gas |
Accelerating voltage | 0 to 8 kV |
Cross-section Milling | |
Maximum milling rate(Material: Si) | ≥ 1 mm/h*1 |
Maximum milling width | 8 mm (with using a wide-area cross-sectional milling holder) |
Maximum sample size | 20(W) × 12(D) × 7(H) mm |
Sample moving range | X ±7 mm, Y 0 to +3 mm |
Ion beam intermittent irradiation | Standard function |
Swing angle | ±15°, ±30°, ±40° |
Flat Milling | |
Milling area | φ32 mm |
Maximum sample size | φ50 × 25(H) mm |
Sample moving range | X 0 to +5 mm |
Ion beam intermittent irradiation | Standard function |
Rotation speed | 1 rpm, 25 rpm |
Tilt | 0 to 90° |
Speak with our experts
Our service and applications support team can advise on the best product solution for your individual needs.