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IM5000 with OM (4)

ArBlade 5000 Ion Milling System

High-performance Ar+ cross-section and flat surface polisher

WHY CHOOSE THE ARBLADE 5000

The sophisticated ion beam milling system from Hitachi can be used to prepare customized cross-sections measuring up to 10 mm wide. It also enhances pre-polished surfaces of samples that are often hard to prepare through conventional means (such as polishing, grinding and cutting).

Features

Processing Performance

  • Custom width uniform cross-sections measuring up to 10 mm wide can be processed
  • Final polishing, for example, for EBSD, utilizing low angle milling (FlatMilling), or for contrasting by high angle milling (relief milling), in just a few minutes
  • A single powerful ion beam gun allows high milling speed
  • Constant ion beam emission from sub-1 kV accelerating voltage
  • Supports fine-surface polishing of sensitive materials
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Easy Sample Handling

  • Milling position can be readjusted at all times without remounting the specimen
  • Ex-situ alignment of mask and cross-sectioning range makes setup fast and easy
  • Resin-embedded samples of up to 25 mm in height and 50 mm in diameter can be loaded for ultimate polishing

Simple Operation

  • Easy maintenance and setup with a single ion beam gun
  • Single button push to initiate a process
  • Programmable multi-step processes
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Extendibility

  • Cryo cooling allows cross-sections on heat sensitive materials
  • Multi-position auto-processing, recipe management and workflow creation
  • Treating oxidation sensitive sample (such as LiB electrodes) without making contact with air

Specifications

Description
Gas used Ar(argon) gas
Accelerating voltage 0 to 8 kV
Cross-section Milling
Maximum milling rate(Material: Si) ≥ 1 mm/h*1
Maximum milling width 8 mm (with using a wide-area cross-sectional milling holder)
Maximum sample size 20(W) × 12(D) × 7(H) mm
Sample moving range X ±7 mm, Y 0 to +3 mm
Ion beam intermittent irradiation Standard function
Swing angle ±15°, ±30°, ±40°
Flat Milling
Milling area φ32 mm
Maximum sample size φ50 × 25(H) mm
Sample moving range X 0 to +5 mm
Ion beam intermittent irradiation Standard function
Rotation speed 1 rpm, 25 rpm
Tilt 0 to 90°

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Our service and applications support team can advise on the best product solution for your individual needs.