Hitachi's world of electron microscopy and sample preparation

Explore our range of electron microscopes and ion beam systems, designed for precision and performance.
Use the filters to find the model that best suits your needs.
Product Category
TM4000PlusIII
TM4000PlusIII

The tabletop microscope for quick and easy SEM imaging and elemental analysis.

Table Top / Compact SEM
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FlexSEMII

Compact SEM with low vacuum function.

Table Top / Compact SEM
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SU3800 / SU3900 Family

Modular VP-SEM platform, available with two different sample chambers and two types of electron optics.

SU3800 / SU3900 VP (FE) SEM Family
SU8700_no-background
SU8700

High-Resolution Schottky VP FE-SEM.

High-Resolution Field Emission SEM
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SU7000

High-Resolution and Analytical Schottky VP FE-SEM with Large Sample Chamber.

High-Resolution Field Emission SEM
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SU8600

High-Resolution FE-SEM with Cold Field Emitter.

High-Resolution Field Emission SEM
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SU9600

Inlens FE-SEM and STEM

High-Resolution Field Emission SEM
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NX5000

FIB-SEM for the highest demands on TEM samples.

Focused Ion Beam Systems
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NX2000

FIB-SEM for the semiconductor sector with 200mm wafer coverage.

Focused Ion Beam Systems
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NX9000

FIB-SEM optimised for the large-volume 3D examinations.

Focused Ion Beam Systems
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HT7800 Family

The fully digital TEM / STEM for all applications, available in 3 models.

Transmission Electron Microscopes
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HF5000

60-200kV ETEM with maximum resolution.

Transmission Electron Microscopes
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ZoneSEMII

UV-Ozone Sample Cleaner for SEM.

Sample and Cross-Section Preparation
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ZoneTEMII

UV-Ozone Sample Cleaner for TEM.

Sample and Cross-Section Preparation
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IM4000II / IM4000II-CTC

Standard Ar+ cross-section and surface polisher.

Sample and Cross-Section Preparation
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IM5000II / IM5000II-CTC

High-perfomance Ar+ ion polisher.

Sample and Cross-Section Preparation

Watch our videos
Video Intro SEM TEM FIB Thumbnail 400x228px

Introducing SEM, TEM, FIB & Prep Solutions From Hitachi High-Tech

Video Intro ArBlade 5000 Thumbnail 400x228px

Introducing the Hitachi High-Tech ArBlade 5000

Video Intro TM4000PlusIII Thumbnail 400x228px

Introducing the Hitachi High-Tech TM4000PlusIII

Video Intro SU8600 Thumbnail 400x228px

Introducing the Hitachi High-Tech CFE - SEM SU8600

Contact us

If you would like help choosing the best SEM for your needs, or if you're looking for advice on how to optimise your microscopy, our experts are ready to assist.

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