SU3900SE
A modular Schottky SEM for large samples and automation, the Hitachi SU3900SE gives you an imaging and analytical solution for a wide range of applications. It delivers high-resolution imaging, easy sample navigation, and advanced automation features - offering reliable, consistent results across different use cases.
ArBlade 5000
The Hitachi ArBlade 5000 ion milling system provides high-precision sample preparation for scanning electron microscopy. Whether you're analyzing metals, semiconductors, polymers, or layered materials, this system ensures high-quality cross-sections and surface polishing with minimal artifacts.
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