IMC21 is an opportunity to explore how Hitachi’s latest electron and ion beam solutions can support your research in nanomaterials, energy materials and life science.
Hear directly from academic users of our instruments in the lunchtime workshop programme, experience new-concept instruments in action, or speak with our applications and design team about your research needs across TEM, FIB & SEM.
On show at IMC21
SU9600 (T)SEM makes its debut
This new-concept instrument is a modular platform for advanced nanomaterials analysis. Bridging the gap between SEM and TEM, the SU9600 provides unique capabilities by combining SEM & STEM imaging, diffraction, EELS, nano-EDS and 4D-STEM together in one high-stability instrument. Perform routine STEM analysis or complex, multi-modal material investigations quicker than ever before. Explore the exciting low-voltage regime below 30kV, all whilst keeping the flexibility of the world’s highest resolution SEM.
See it in action at Booth 149
HT7800II 120kvTEM
High-performance 120kV TEM imaging made easy, including tomography and cryo capabilities

IM5000 broad ion beam (BIB)
Overcome the speed limitations of your FIB and reveal low damage cross-sections up to 40mm wide, giving you more data for more reliable analysis

SU3900SE Schottky VP-SEM
Handle the largest specimens and automate complex tasks with the help of Hitachi’s powerful EM Flow Creator. (Located at Bruker Booth 125)

TM4000PlusIII
The latest generation of Hitachi’s popular tabletop SEM brings new capabilities with super-fast EDS and powerful automation

Join our user-led education programme
Hear from the expert users of some of our latest instruments including:
- Prof Frances Ross (MIT) on UHV in-situ TEM
- Prof Quentin Ramasse (SuperSTEM) on multi-modal low kV STEM
- Prof Arthur Blackburn (University of Victoria) on Ptychography from 20-300kV
Programme timing and further information to follow. Watch this space!
Find us at IMC21
Booth 149