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Hitachi's world of electron microscopy and sample preparation

Explore our range of electron microscopes and ion beam systems, designed for precision and performance.
Use the filters to find the model that best suits your needs.
Product Category
TM4000 III
TM4000 III

The tabletop microscope for quick and easy SEM imaging and elemental analysis.

Table Top / Compact SEM
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FlexSEM II

Compact SEM with low vacuum function.

Table Top / Compact SEM
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SU3800 / SU3900 Family

Modular VP-SEM platform, available with two different sample chambers and two types of electron optics.

SU3800 / SU3900 VP (FE) SEM Family
SU8700_no-background
SU8700

High-Resolution Schottky VP FE-SEM.

High-Resolution Field Emission SEM
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SU7000

High-Resolution and Analytical Schottky VP FE-SEM with Large Sample Chamber.

High-Resolution Field Emission SEM
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SU8600

High-Resolution FE-SEM with Cold Field Emitter.

High-Resolution Field Emission SEM
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SU9000 II

Inlens FE-SEM and STEM

High-Resolution Field Emission SEM
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NX5000

FIB-SEM for the highest demands on TEM samples.

Focused Ion Beam Systems
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NX2000

FIB-SEM for the semiconductor sector with 200mm wafer coverage.

Focused Ion Beam Systems
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NX9000

FIB-SEM optimised for the large-volume 3D examinations.

Focused Ion Beam Systems
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HT7800 Family

The fully digital TEM / STEM for all applications, available in 3 models.

Transmission Electron Microscopes
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HF5000

60-200kV ETEM with maximum resolution.

Transmission Electron Microscopes
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ZoneSEM II

UV-Ozone Sample Cleaner for SEM.

Sample and Cross-Section Preparation
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ZoneTEM II

UV-Ozone Sample Cleaner for TEM.

Sample and Cross-Section Preparation
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IM4000 II / IM4000 II-CTC

Standard Ar+ cross-section and surface polisher.

Sample and Cross-Section Preparation
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ArBlade 5000 II / IM5000 II-CTC

High-perfomance Ar+ ion polisher.

Sample and Cross-Section Preparation

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