Electron Microscopes and Ion Beam Systems

Visit us at K2025 |  Hall 11  |  Stand D07

08 - 15 October 2025 | Düsseldorf, Germany

In action at K2025

TM4000PlusIII

The Hitachi TM4000PlusIII scanning electron microscope offers a compact, user-friendly solution for imaging and elemental analysis. Designed for a range of users - from research labs to industrial quality control - this new tabletop SEM gives you reliable imaging capabilities without the costs and space requirements of a traditional SEM.

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Hitachi_Features_TM4000_5

 

Also on Stand D07

Discover Hitachi High-Tech’s range of thermal, handheld and benchtop XRF analysers for R&D, process and quality control, and RoHS compliance verification in polymer manufacturing. Schedule a demo on their website.