Electron Microscopes and Ion Beam Systems
Visit us at K2025 | Hall 11 | Stand D07
08 - 15 October 2025 | Düsseldorf, Germany
In action at K2025
TM4000PlusIII
The Hitachi TM4000PlusIII scanning electron microscope offers a compact, user-friendly solution for imaging and elemental analysis. Designed for a range of users - from research labs to industrial quality control - this new tabletop SEM gives you reliable imaging capabilities without the costs and space requirements of a traditional SEM.
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Also on Stand D07
Discover Hitachi High-Tech’s range of thermal, handheld and benchtop XRF analysers for R&D, process and quality control, and RoHS compliance verification in polymer manufacturing. Schedule a demo on their website.