Hitachi High-tech Europe | Battery Cells & Systems Expo Registration

Explore how our electron microscopes and ion beam systems can help you understand and control battery materials. Schedule a chat with our experts to discuss your challenges at the Battery Cells & Systems Expo.

In action at the show

ArBlade 5000

High-precision sample preparation for scanning electron microscopy, the ArBlade 5000 BIB milling system cuts through hard/soft, mixed, and heat-sensitive materials with near-zero artefacts. It’s the ideal system for lithium-ion batteries due to its ultra-wide cross-sectioning capabilities (1–40mm).

ArBlade 5000 product image

TM4000PlusIII

A compact, user-friendly solution for imaging and elemental analysis. Designed for a range of users - from research labs to industrial quality control - this new tabletop SEM gives you reliable imaging capabilities without the costs and space requirements of a traditional SEM.

SelectScience_TM4000_image_2

Plus, learn about our line-up of FE SEMs at Booth 1836.

Join our technology showcase

Understanding and controlling battery materials – with ion beam cross-sectioning and SEM

Making wide, high-quality cross-sections of electrodes is critical to give a proper understanding of cell structures and performance. See how coating thickness, tortuosity, binder distribution, SEI formation or particle cracking can be studied more precisely than ever before with ultra-wide broad ion-beam cross-sections and AI image analysis. Wednesday 9 July, 12:50 in Hall 6, Theatre 6.

Also at the Advanced Materials Show, Booth 1233

Hitachi High-Tech Analytical Science

Discover Hitachi High-Tech’s range of thermal, benchtop XRF coatings and handheld XRF analysers for the polymer and metals measurements in research and development, process, and quality control. Schedule a demo on their website.

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