Understand structures and materials at the nanoscale
Designed for stability and robustness, our electron microscopes deliver fast, reliable results every time.
The Hitachi way

Proven innovation
50+ years of leadership
in electron microscopy

Complete solutions
A comprehensive, complementary
product range

Full support
360° customer service from
purchase to maintenance
Solutions for every application
Hitachi’s electron microscopes and ion beam systems deliver precision and performance for any
research requirement. From entry-level tabletop SEMs to advanced FIB-SEMs, our technology
provides reliable results across key industries:

Life Sciences
Visualise cells, structures, and molecular interactions.

Materials Science
Analyse structures, properties and atomic arrangements.

Electronics
Reveal nanoscale details, defects, and compositions.
Explore our product highlights

FlexSEM II
Offering full SEM functionality in a compact, intuitive design, it's the ideal system for superior imaging and detector variability without the cost of a classic SEM.

SU3900 / SU3800 Family
Focused on enhancing productivity, these tools automate repetitive tasks, so you can achieve reproducible results quickly with little manual effort.
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TM4000PlusIII Tabletop SEM
Bridging the gap between optical microscopy and conventional large SEMs, the TM4000PlusIII is a high-performance tabletop SEM for flexible imaging needs in academia and industry.

ArBlade 5000
The most advanced broad ion beam system for producing exceptionally high-quality cross-section or flat-milling samples for electron microscopy.

FlexSEM II
Offering full SEM functionality in a compact, intuitive design, it's the ideal system for superior imaging and detector variability without the cost of a classic SEM.

SU3900 / SU3800 Family
Focused on enhancing productivity, these tools automate repetitive tasks, so you can achieve reproducible results quickly with little manual effort.
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TM4000PlusIII Tabletop SEM
Bridging the gap between optical microscopy and conventional large SEMs, the TM4000PlusIII is a high-performance tabletop SEM for flexible imaging needs in academia and industry.

ArBlade 5000
The most advanced broad ion beam system for producing exceptionally high-quality cross-section or flat-milling samples for electron microscopy.

FlexSEM II
Offering full SEM functionality in a compact, intuitive design, it's the ideal system for superior imaging and detector variability without the cost of a classic SEM.
Product Range
-
Tabletop / Compact SEM
Get the power and flexibility of a full-size Scanning Electron Microscope in a compact, user-friendly design. Perfect for detailed analysis with the simplicity of a benchtop SEM model.
TM4000 III
FLEXSEM II
-
VP (FE) SEM Family
Maximise productivity with automated tools that handle repetitive tasks, delivering consistent, reproducible results with minimal effort.
SU3800 / SU3800 SE
SU3900 / SU3900 SE
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High-Resolution Field Emission SEM
Experience nanoscale precision and powerful analysis with our high resolution microscopes. These FE-SEMs feature both Schottky and Cold Field Emitters.
SU8700
SU7000
SU8600
SU9000 II
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Focused Ion Beam Systems
Designed for advanced applications, our FIB-SEMs offer unparalleled capabilities for studying even the most complex materials.
NX2000
NX5000
NX9000
-
Transmission Electron Microscopes
User-friendly TEM and STEM systems for detailed structural and chemical analysis of nanomaterials, semiconductors, energy tech, polymers, and more.
HT7800 Family
HF5000
-
Sample Preparation
Ensure top-quality results with our sample preparation instruments, designed to optimise even the most advanced microscopy techniques.
ZoneTEM II
ZoneSEM II
IM4000 II / IM4000 II-CTC
ArBlade 5000 / IM5000-CTC
Product Range
Table Top / Compact SEM
Get the power and flexibility of a full-size SEM in a compact, user-friendly design.Perfect for detailed analysis with the simplicity of a tabletop model.

TM4000 III

FLEXSEM II
VP (FE) SEM Family
Maximise productivity with automated tools that handle repetitive tasks, delivering consistent, reproducible results with minimal effort.

SU3800 / SU3800 SE

SU3900 / SU3900 SE
High-Resolution Field Emission SEM
Experience nanoscale precision and powerful analysis with our high-resolution FE-SEMs, featuring both Schottky and Cold Field Emitters.

SU8700

SU7000

SU8600

SU9000 II
Focused Ion Beam Systems
Designed for advanced applications, our FIB-SEMs offer unparalleled capabilities for studying even the most complex materials.

NX2000

NX5000

NX9000
Transmission Electron Microscopes
User-friendly TEM and STEM systems for detailed structural and chemical analysis of nanomaterials, semiconductors, energy tech, polymers, and more.

HT7800 Family

HF5000
Sample Preparation
Ensure top-quality results with our sample preparation instruments, designed to optimise even the most advanced microscopy techniques.

ZoneTEM II

ZoneSEM II

IM4000 II / IM4000 II-CTC

ArBlade 5000 / IM5000-CTC
“I would definitely recommend Hitachi to other interested parties and would also choose Hitachi again in a subsequent decision.”
BIOTRONIK representative, user of SU7000 SEM and ArBlade 5000

Expert guidance
from local teams
Our UK, German and Italy-based experts are here to help you find the right solution.
From product selection to installation and ongoing support, we’ll guide you every step of the way.