Understand structures and materials at the nanoscale

Designed for stability and robustness, our electron microscopes deliver fast, reliable results every time.

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Proven innovation

50+ years of leadership
in electron microscopy

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Complete solutions

A comprehensive, complementary
product range

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Full support

360° customer service from
purchase to maintenance

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Life Sciences

Visualise cells, structures, and molecular interactions.

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Materials Science

Analyse structures, properties and atomic arrangements.

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Electronics

Reveal nanoscale details, defects, and compositions.

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SU3900 / SU3800 Family

Focused on enhancing productivity, these tools automate repetitive tasks, so you can achieve reproducible results quickly with little manual effort.

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TM4000PlusIII Tabletop SEM

Bridging the gap between optical microscopy and conventional large SEMs, the TM4000PlusIII is a high-performance tabletop SEM for flexible imaging needs in academia and industry.

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ArBlade 5000

The most advanced broad ion beam system for producing exceptionally high-quality cross-section or flat-milling samples for electron microscopy.

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FlexSEM II

Offering full SEM functionality in a compact, intuitive design, it's the ideal system for superior imaging and detector variability without the cost of a classic SEM.

Product Range

Table Top / Compact SEM

VP (FE) SEM Family

High-Resolution Field Emission SEM

Focused Ion Beam Systems

Transmission Electron Microscopes

Sample Preparation

Table Top / Compact SEM

Get the power and flexibility of a full-size SEM in a compact, user-friendly design.Perfect for detailed analysis with the simplicity of a tabletop model.

TM4000 III

TM4000 III

FLEXSEM II

FLEXSEM II

Explore Table Top SEM

VP (FE) SEM Family

Maximise productivity with automated tools that handle repetitive tasks, delivering consistent, reproducible results with minimal effort.

SU3800 / SU3800 SE

SU3800 / SU3800 SE

SU3900 / SU3900 SE

SU3900 / SU3900 SE

Explore VP (FE) SEM

High-Resolution Field Emission SEM

Experience nanoscale precision and powerful analysis with our high-resolution FE-SEMs, featuring both Schottky and Cold Field Emitters.

SU8700

SU8700

SU7000

SU7000

SU8600

SU8600

SU9000 II

SU9000 II

Explore FE SEM

Focused Ion Beam Systems

Designed for advanced applications, our FIB-SEMs offer unparalleled capabilities for studying even the most complex materials.

NX2000

NX2000

NX5000

NX5000

NX9000

NX9000

Explore FIB-SEM

Transmission Electron Microscopes

User-friendly TEM and STEM systems for detailed structural and chemical analysis of nanomaterials, semiconductors, energy tech, polymers, and more.

HT7800 Family

HT7800 Family

HF5000

HF5000

Explore TEM and STEM

Sample Preparation

Ensure top-quality results with our sample preparation instruments, designed to optimise even the most advanced microscopy techniques.

ZoneTEM II

ZoneTEM II

ZoneSEM II

ZoneSEM II

IM4000 II / IM4000 II-CTC

IM4000 II / IM4000 II-CTC

ArBlade 5000 / IM5000-CTC

ArBlade 5000 / IM5000-CTC

Explore Sample Prep

“I would definitely recommend Hitachi to other interested parties and would also choose Hitachi again in a subsequent decision.”

BIOTRONIK representative, user of SU7000 SEM and ArBlade 5000

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Expert guidance
from local teams

Our UK, German and Italy-based experts are here to help you find the right solution.

From product selection to installation and ongoing support, we’ll guide you every step of the way.

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