Scientists and engineers working to develop or manufacture batteries know how challenging it can be to understand, monitor and control the multitude of parameters which affect cell performance.
Our latest whitepaper explores how advanced cross-sectional analysis of electrodes using SEM and broad ion beam (BIB) milling is helping researchers and manufacturers develop better batteries.
What you’ll learn in our new whitepaper
How to study and quantify critical electrode parameters such as coating thickness, particle size, SEI formation-tortuosity, binder distribution and cracking
Why Broad Ion Beam Milling is the ideal technique for electrode cross-sectioning
How automation and AI are transforming image analysis and QC
How to reliably study electrodes after formation or cycling using vacuum transfer
Preparing ultra-wide cross-sections for improved statistical control
