Hitachi High-Tech Europe

Surface roughness and topography play a crucial role in how materials and components perform, from friction and wear to adhesion, sealing, and lifetime. While stylus profilometers and optical surface profilers remain essential tools, many real-world surfaces are simply difficult to measure reliably with these techniques.

This is where scanning electron microscopy (SEM), combined with Hitachi map 3D, offers a powerful and practical complement.

What you will learn:

This session explores how scanning electron microscopy (SEM) can complement conventional surface metrology techniques when surfaces are rough, nano-structured, or optically challenging.

You will learn how multi-segment backscattered electron detection and Hitachi map 3D enable quantitative 3D surface reconstruction, and how this approach compares with stylus profilometry and optical methods.

Who should attend?

This webinar is intended for engineers, researchers, and materials specialists involved in surface characterization or materials analysis.

It is particularly relevant for those working in materials science, coatings, tribology, additive manufacturing, batteries, or micro-/nano-structured materials, as well as anyone using SEM or surface metrology tools who wants to extend their surface analysis capabilities.

Speakers

Mats Eriksson
CEO, Spectral AB
Mats Eriksson is the CEO of Spectral AB and has worked in electron microscopy for over 30 years. As a long-standing partner and distributor of Hitachi SEM solutions.

Stefan Rosén
Founder of Toponova AB
Over 2,600 industrial quality/metrology projects since 1995, SIS Standard Developer in ISO GPS: Metrology and Surface texture - SIS/TK 507 AG 06 Swedish Expert in ISO Standardization -TC 213 WG16 (surface texture)

SEM for Surface Metrology: When Optical and Stylus Methods Are Not Enough

Live Webinar and Q&A

Speakers