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SU8600

Cold Field Emission SEM

The CFE-SEM for ultra-high spatial resolution, multi-perspective imaging
  • Ultra-high resolution of 0.6 nm at 15 kV and 0.7 nm at 1 kV.
  • Advanced automation for consistent, repeatable workflows.
  • Display up to six imaging signals at the same time.
  • Fast and easy specimen loading through standard six inch exchange chamber.

Overview

The SU8600 is a dedicated imaging SEM offering ultra-high resolution thanks to Hitachi’s cold field emission (CFE) technology. Designed to meet the needs of research scientists, lab managers, and industrial users alike, the SU8600 CFE-SEM delivers excellent spatial resolution and automation for modern labs.
1, 2, 4 or 6 signals can be displayed at the same time on a single monitor. By adding a second screen, the dual-monitor configuration boosts productivity and expands your workspace. Dual monitors also allow you to customise the operation panel with submenus positioned anywhere on either screen.

Features and benefits

Specifications

Electron Optics
Resolution 0.6 nm @ 15 kV, 0.7nm @ 1kV
Magnification 20 to 2,000,000x
Voltage Range 0.5 to 30 kV
Specimen Stage
Stage Control Motorized 5-axis control
X/Y/Z range 0–110 mm / 1.5–40 mm
Tilt -5° to 70°
Detectors
Standard Detectors Optional Detectors
Upper Detector (UD) Top Detector (TD)

In Column Middle Detector (IMD)

Photo Diode BSE (PD-BSE)

Out Column Detector (OCD)

Bright Field TE (BFSTEM)

Dark Field TE (DFSTEM)

Cathodoluminescence Detector (CL)

EDX, EBSD
Lower Detector (LD)  
Optional Accessories EDX and EBSD

Applications gallery

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Self Assembling Magnetic Iron Oxide Nanoparticles

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Ultrastructure of Arabidopsis

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Cross Section Images of 3D NAND

Contact us

Our specialists are here to guide you in selecting the right SEM for your needs. Reach out to learn how the SU8600 can enhance your lab’s imaging capabilities, streamline workflows, and support your scientific or industrial applications.