Today's Electron Backscatter Diffraction (EBSD) detectors can index a Kikuchi pattern in under a millisecond, offering rapid insights into the diffraction structure of crystalline materials.

Paired with an analytical SEM featuring high probe currents, you can record high-quality EBSD mappings in just a few minutes. However, the true potential of your analysis can be hindered by surface contamination from atmospheric exposure, amorphous oxide layers, or damage from traditional mechanical preparation.

In this whitepaper, we share how Broad Ion Beam (BIB) milling, an innovative SEM sample preparation technique, effectively removes these surface artifacts to enhance EBSD analysis. Download the whitepaper to:

• Discover how Broad Ion Beam (BIB) milling enhances EBSD analysis
• Learn about using BIB with the Hitachi ArBlade 5000 to transform EBSD analysis of a 2-phase as-cast nickelbase
• Understand how precise BIB techniques improve your examination before and after BIB end polishing