The future of energy storage depends on our ability to manufacture better batteries. But achieving this goal becomes more difficult as electrode materials advance and cell chemistries become more complex.
Many of the most common (and costly) problems in battery performance, such as yield loss, capacity fade, or safety failures, stem from physical defects at the micro or nanoscale. These include cracking, particle agglomeration, inconsistent coatings, or delamination. The challenge is: how do you reliably detect and analyze these issues, especially at scale?
That’s where broad ion beam (BIB) milling and scanning electron microscopy (SEM) come in. A new whitepaper from Hitachi High-Tech Europe outlines a comprehensive workflow that combines ultra-precise cross-sectioning with automated SEM analysis and AI-driven image interpretation. The result? A powerful toolkit for improving quality, safety, and performance across the battery development lifecycle.
You can read the full whitepaper here
In this article, we unpack the key takeaways through a Q&A format designed to help battery scientists understand what’s possible with today’s analysis tools. And how they can apply them in their own labs or manufacturing lines.
Let’s start with the first question.
From lab bench to factory floor, BIB milling and SEM are reshaping how battery R&D approaches quality and safety. These tools don’t just reveal problems, they help you prevent them.
With advanced automation, deep learning, and ultra-wide cross-sectioning, the combination of BIB and SEM systems empowers teams to move faster, analyze smarter, and deliver batteries that perform better.