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Electron Microscopy and Sample Preparation


SEM | FIB | BIB | TEM
Product Catalogue 2025 / 2026


Discover Hitachi's complete range of electron and ion beam systems in the newest overview catalogue.

What's included

  • Straightforward product overview section, categorised by product class
  • Product descriptions, features, and application examples
  • Optional accessories and a complete range of software extensions
  • In-depth explanations of Electron Sources and Lens Types

Our extensive product selection and expertise make us the top choice for scientists in the European market. See for yourself.

English catalogue
German catalogue

Speak with our experts

Our service and applications support team can advise on the best product solution for your individual needs.