Control
23 - 26 April | Stuttgart
Get your material sample tested with our experts at Control, the international trade fair for quality assurance
See Hitachi's Electron Microscopy and Ion Beam Milling systems in action with our expert team on-site. Arrange a live demonstration with your material sample by completing the form.
Find us at Hall 8, Stand 8506
TM4000 - on show at Control
Bridging the gap between optical microscopy and conventional large SEMs, the TM4000 makes advanced electron microscopy quick and easy for any user.
High resolution, high contrast, large depth-of-focus imaging, and rapid identification of chemical element distribution are achieved with minimal sample preparation time.
ArBlade 5000 - on show at Control
Discover the powerful tool revolutionising SEM sample preparation. Using Broad Ion Beam (BIB) milling, the ArBlade 5000 produces defect-free, millimeter-order smooth specimen surfaces for further analysis - even on highly complex and sensitive specimens.
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