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Whitepaper

Combining SEM and broad ion beam milling to better understand LiB materials

As the demand for decarbonising energy supply and storage accelerates, lithium-ion-based devices (LiBs) are taking centre stage in the development of advanced battery technologies.

Scanning Electron Microscopy (SEM) is a go-to method for analysing the structural and chemical properties of battery materials in both R&D and failure analysis. However, achieving accurate insights into the structure and properties of these devices requires precise preparation and analysis.

Download the whitepaper to learn how to overcome these challenges and transform your research on LiB materials through the combination of SEM and broad ion beam milling. We provide in-depth insights into workflows and instrumentation that offer:

  • A deeper understanding of battery materials, leading to enhanced battery performance and lifespan
  • The ability to produce high-quality cross-sections through various LiB components, including raw powder materials, electrodes, separators, and complete devices
  • Techniques for imaging and compositional analysis, as well as workflows for handling oxidation-sensitive materials

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