Hitachi High-Tech Europe

Your Top Questions Answered: Broad Ion Beam Milling with Hitachi's IM4000II & ArBlade 5000

Written by Sample Author | May 28, 2025 1:41:04 PM

In scanning electron microscopy (SEM), outstanding results begin with outstanding sample preparation.

When dealing with delicate structures, mixed-material composites, or complex multilayers, traditional methods like mechanical polishing can fall short - introducing artifacts, surface damage, or thermal stress.

That's why more labs are turning to broad ion beam (BIB) milling using systems like the Hitachi IM4000II and ArBlade 5000. These tools allow for fast, precise, and stress-free cross-sectioning and flat milling across a wide range of materials.

During a recent webinar, attendees asked excellent questions about BIB milling and the capabilities of Hitachi's systems. We've compiled the answers here to help you decide whether ion milling is the right solution for your lab.