Your Questions Answered: Optimizing SEM Sample Preparation with Broad Ion Beam Milling

Achieving high-quality imaging in scanning electron microscopy (SEM) depends not just on the power of the microscope but also on how well the sample is prepared.

Traditional preparation methods like mechanical polishing and chemical etching can introduce artifacts, surface damage, and thermal effects, which compromise imaging accuracy.

This is where broad ion beam (BIB) milling comes in. Systems like the Hitachi IM4000II and ArBlade 5000 offer a contact-free, high-precision alternative to traditional techniques, ensuring artifact-free, high-resolution SEM imaging.

To help you understand how ion milling enhances your SEM workflow, we've compiled answers to some of the most frequently asked questions.